Université Paris 6
Pierre et Marie Curie
Université Paris 7
Denis Diderot

CNRS U.M.R. 7599
``Probabilités et Modèles Aléatoires''

On the excursions of reflected LÚvy processes

Auteur(s):

Code(s) de Classification MSC:

RÚsumÚ: In this paper, we give under mild integrability assumptions an analytical characterization of the law of the height of the generic excursion for a LÚvy process $X$ reflected at its maximum. We also give (yet) another proof of a description of It˘'s excursion measure of the reflected process away from 0.

Mots ClÚs: Reflected LÚvy processes ; excursions ; height of an excursion ; two-sided exit ; integral equation ; excursion measure ; Williams' description

Date: 2003-10-06

Prépublication numéro: PMA-852